株式会社極東書店トップ商品一覧Deep Learning for Advanced X-ray Detection and Imaging Applications.

商品詳細

Deep Learning for Advanced X-ray Detection and Imaging Applications.

Deep Learning for Advanced X-ray Detection and Imaging Applications.

・ISBN 978-3-031-75655-9 paper EUR 129.99

¥34,745.- (税込) (※)価格はご注文時の参考価格となります。
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お気に入り
著者・編者Iniewski, Krzysztof (Kris) / Cai, Liang (Kevin) (eds.),
出版社 (Springer International Publishing AG, SZ)
出版年月2026
ページ数261 pp.
言語ENG
ニュース番号<A05-93673>

解説

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.