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VLSI Design and Test: 29th International Symposium, VDAT 2025, Chandigarh, India, August 7-9, 2025, Proceedings, Part II.

VLSI Design and Test: 29th International Symposium, VDAT 2025, Chandigarh, India, August 7-9, 2025, Proceedings, Part II.

・ISBN 978-3-032-26297-4 paper EUR 109.99

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著者・編者Rawat, Brajesh / Shirmali, Hitesh / Malhotra, Shivani / Sharma, Rohit Y. / Goel, Neeraj (eds.),
シリーズ (Communications in Computer and Information Science)
出版社 (Springer Nature Switzerland AG, SZ)
出版年月2026
ページ数789 pp.
言語ENG
ニュース番号<A05-68248>

解説

This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7-9, 2025.

The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures.