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商品詳細
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Softcover reprint of the original 1st ed. 2003
・ISBN 978-1-4757-8474-9 paper EUR 149.99
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| 著者・編者 | Adams, R. Dean, |
|---|---|
| シリーズ | (Frontiers in Electronic Testing) |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2013 |
| ページ数 | 250 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-55669＞ |
解説
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.