株式会社極東書店トップ ＞ 商品一覧 ＞ Modeling Nanoscale Imaging in Electron Microscopy. 2012 ed.
商品詳細
Modeling Nanoscale Imaging in Electron Microscopy. 2012 ed.
・ISBN 978-1-4899-9728-9 paper EUR 99.99
￥26,726.- (税込) ※（※）価格はご注文時の参考価格となります。
納品価格につきましては書籍の入荷時点で確定となります。
版元の原価改定、外国為替の変動等により異なる場合がございますので、予めご了承下さい。
| 著者・編者 | Vogt, Thomas / Dahmen, Wolfgang / Binev, Peter (eds.), |
|---|---|
| シリーズ | (Nanostructure Science and Technology) |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2014 |
| ページ数 | 182 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-54030＞ |
解説
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.