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商品詳細
Digital Noise Monitoring of Defect Origin. 1st ed. Softcover of orig. ed. 2007
・ISBN 978-1-4419-4410-8 paper EUR 99.99
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| 著者・編者 | Aliev, Telman, |
|---|---|
| シリーズ | (Lecture Notes in Electrical Engineering) |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2010 |
| ページ数 | 224 pp. |
| 言語 | ENG |
| ニュース番号 | <A05-52549> |
解説
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.