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商品詳細
Quantum Metrology, Imaging, and Communication. 1st ed. 2017
・ISBN 978-3-319-46549-4 hard EUR 149.99
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| 著者・編者 | Simon, David S. / Jaeger, Gregg / Sergienko, Alexander V., |
|---|---|
| シリーズ | (Quantum Science and Technology) |
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2016 |
| ページ数 | 273 pp. |
| 言語 | ENG |
| ニュース番号 | <A05-48672> |
解説
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.