株式会社極東書店トップ商品一覧Metrology and Physical Mechanisms in New Generation Ionic Devices. 1st ed. 2016

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Metrology and Physical Mechanisms in New Generation Ionic Devices. 1st ed. 2016

Metrology and Physical Mechanisms in New Generation Ionic Devices. 1st ed. 2016

・ISBN 978-3-319-39530-2 hard EUR 99.99

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お気に入り
著者・編者Celano, Umberto,
シリーズ (Springer Theses)
出版社 (Springer International Publishing AG, SZ)
出版年月2016
ページ数175 pp.
言語ENG
ニュース番号<A05-47909>

解説

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.