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Hot Carrier Degradation in Semiconductor Devices. 2015 ed.
・ISBN 978-3-319-08993-5 hard EUR 99.99
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| 著者・編者 | Grasser, Tibor (ed.), |
|---|---|
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2014 |
| ページ数 | 517 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-46676＞ |
解説
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.