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Built-in-Self-Test and Digital Self-Calibration for RF SoCs. 2012
・ISBN 978-1-4419-9547-6 paper EUR 49.99
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| 著者・編者 | Bou-Sleiman, Sleiman / Ismail, Mohammed, |
|---|---|
| シリーズ | (SpringerBriefs in Electrical and Computer Engineering) |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2011 |
| ページ数 | 89 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-45487＞ |
解説
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.