株式会社極東書店トップ ＞ 商品一覧 ＞ Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability. 2008 ed.
商品詳細
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability. 2008 ed.
・ISBN 978-0-387-74746-0 hard EUR 149.99
￥40,091.- (税込) ※（※）価格はご注文時の参考価格となります。
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| 著者・編者 | Tehranipoor, Mohammad (ed.), |
|---|---|
| シリーズ | (Frontiers in Electronic Testing) |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2007 |
| ページ数 | 408 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-43833＞ |
解説
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.