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商品詳細
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. Softcover reprint of the original 1st ed. 2007
・ISBN 978-1-4939-5036-2 paper EUR 299.99
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| 著者・編者 | Kalinin, Sergei V. / Gruverman, Alexei, |
|---|---|
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2016 |
| ページ数 | 980 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-40334＞ |
解説
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.