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商品詳細
Debug Automation from Pre-Silicon to Post-Silicon. Softcover reprint of the original 1st ed. 2015
・ISBN 978-3-319-35610-5 paper EUR 49.99
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| 著者・編者 | Dehbashi, Mehdi / Fey, Goerschwin, |
|---|---|
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2016 |
| ページ数 | 171 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-40016＞ |
解説
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.
- Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;
- Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;
- Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.