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商品詳細
Bias Temperature Instability for Devices and Circuits. Softcover reprint of the original 1st ed. 2014
・ISBN 978-1-4939-5529-9 paper EUR 109.99
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| 著者・編者 | Grasser, Tibor (ed.), |
|---|---|
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2016 |
| ページ数 | 810 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-39636＞ |
解説
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.