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商品詳細
CMOS Test and Evaluation: A Physical Perspective. 2015 ed.
・ISBN 978-1-4939-1348-0 hard EUR 169.99
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お気に入り
★★★
| 著者・編者 | Bhushan, Manjul / Ketchen, Mark B., |
|---|---|
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2014 |
| ページ数 | 424 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-38514＞ |
解説
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.