株式会社極東書店トップ商品一覧Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs. Softcover reprint of the original 1st ed. 2004

商品詳細

Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs. Softcover reprint of the original 1st ed. 2004

Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs. Softcover reprint of the original 1st ed. 2004

・ISBN 978-1-4757-7949-3 paper EUR 99.99

¥26,726.- (税込) (※)価格はご注文時の参考価格となります。
納品価格につきましては書籍の入荷時点で確定となります。
版元の原価改定、外国為替の変動等により異なる場合がございますので、予めご了承下さい。

お気に入り
著者・編者Pinhong Chen / Kirkpatrick, Desmond A. / Keutzer, Kurt,
出版社 (Springer-Verlag New York Inc., US)
出版年月2013
ページ数113 pp.
言語ENG
ニュース番号<A05-38220>

解説

As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst case delay. The latter approach not only reduces delay calculation accuracy, but can also be shown to underestimate the delay in certain scenarios.
This book describes accurate but conservative methods for computing delay variation due to coupling. Furthermore, most of these methods are computationally efficient enough to be employed in a static timing analysis tool for complex integrated digital circuits. To achieve accuracy, a more accurate computation of the Miller factor is derived. To achieve both computational efficiency and accuracy, a variety of mechanisms for pruning the search space are detailed, including:

-Spatial pruning - reducing aggressors to those in physical proximity,
-Electrical pruning - reducing aggressors by electrical strength,
-Temporal pruning - reducing aggressors using timing windows,
-Functional pruning - reducing aggressors by Boolean functional analysis.