株式会社極東書店トップ商品一覧Pattern Recognition and Machine Learning: Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18-20, 1970. Softcover reprint of the original 1st ed. 1971

商品詳細

Pattern Recognition and Machine Learning: Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18-20, 1970. Softcover reprint of the original 1st ed. 1971

Pattern Recognition and Machine Learning: Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18-20, 1970. Softcover reprint of the original 1st ed. 1971

・ISBN 978-1-4615-7568-9 paper EUR 119.99

¥32,072.- (税込) (※)価格はご注文時の参考価格となります。
納品価格につきましては書籍の入荷時点で確定となります。
版元の原価改定、外国為替の変動等により異なる場合がございますので、予めご了承下さい。

お気に入り
著者・編者Fu, King-Sun (ed.),
出版社 (Springer-Verlag New York Inc., US)
出版年月2012
ページ数344 pp.
言語ENG
ニュース番号<A05-37698>

解説

This book contains the Proceedings of the US-Japan Seminar on Learning Process in Control Systems. The seminar, held in Nagoya, Japan, from August 18 to 20, 1970, was sponsored by the US-Japan Cooperative Science Program, jointly supported by the National Science Foundation and the Japan Society for the Promotion of Science. The full texts of all the presented papers except two t are included. The papers cover a great variety of topics related to learning processes and systems, ranging from pattern recognition to systems identification, from learning control to biological modelling. In order to reflect the actual content of the book, the present title was selected. All the twenty-eight papers are roughly divided into two parts--Pattern Recognition and System Identification and Learning Process and Learning Control. It is sometimes quite obvious that some papers can be classified into either part. The choice in these cases was strictly the editor's in order to keep a certain balance between the two parts. During the past decade there has been a considerable growth of interest in problems of pattern recognition and machine learn- ing. In designing an optimal pattern recognition or control system, if all the a priori information about the process under study is known and can be described deterministically, the optimal system is usually designed by deterministic optimization techniques.