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Predictive Technology Model for Robust Nanoelectronic Design. 2011 ed.
・ISBN 978-1-4614-0444-6 hard EUR 99.99
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| 著者・編者 | Cao, Yu, |
|---|---|
| シリーズ | (Integrated Circuits and Systems) |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2011 |
| ページ数 | 173 pp. |
| 言語 | ENG |
| ニュース番号 | <A05-36697> |
解説
Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.