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Name: Integrated Circuit Test Engineering: Modern Techniques. 2006 ed.
Author: Grout, Ian A.
ISBN: 978-1-84628-023-8

Integrated Circuit Test Engineering: Modern Techniques. 2006 ed.

・ISBN 978-1-84628-023-8 paper

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著者・編者	Grout, Ian A.,
出版社	(Springer London Ltd, UK)
出版年月	2005
ページ数	362 pp.
言語	ENG
ニュース番号	＜A05-35965＞

解説

Taking a three-pronged approach - test engineering from traditional-test, design and manufacturing view-points - Integrated Circuit Test Engineering encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment and the economics of testing.

The text incudes:

* Worked examples and exercises, well-organized references and bibliography.

* An introduction to the use of various software and languages such as MATLAB^(R), Spice, Verilog^(R)-HDL and VHDL.

* A series of experiments based on material downloaded from springeronline.com showing how to construct a hardware test arrangement for MS Windows PCs.

This book is a practical tool for advanced undergraduate and graduate electronic engineering students, a resource for their tutors and a guide for the practising electronic engineer.