株式会社極東書店トップ ＞ 商品一覧 ＞ Challenges in Mechanics of Time-Dependent Materials, Volume 2: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics. 2015 ed.
商品詳細
Challenges in Mechanics of Time-Dependent Materials, Volume 2: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics. 2015 ed.
・ISBN 978-3-319-06979-1 hard EUR 149.99
￥40,091.- (税込) ※（※）価格はご注文時の参考価格となります。
納品価格につきましては書籍の入荷時点で確定となります。
版元の原価改定、外国為替の変動等により異なる場合がございますので、予めご了承下さい。
| 著者・編者 | Qi, H. Jerry / Antoun, Bonnie / Hall, Richard / Lu, Hongbing / Arzoumanidis, Alex / Silberstein, Meredith / Furmanski, Jevan / Amirkhizi, Alireza / Gonzalez-Gutierrez, Joamin (eds.), |
|---|---|
| シリーズ | (Conference Proceedings of the Society for Experimental Mechanics Series) |
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2014 |
| ページ数 | 196 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-30169＞ |
解説
Challenges in Mechanics of Time-Dependent Materials, Volume 2: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics, the second volume of eight from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on fundamental and applied aspects of Experimental Mechanics, including papers in the following general technical research areas:
Metallic, Polymeric and Composite Materials
o Effects of Extreme Environments including Radiation Resistance, Damage, and Aging
o Challenges in Time-dependent Behavior Modeling of Low, Moderate and High Strain Rates
o Effects of Inhomogeneities on the Time-Dependent Behavior
o Time dependent granular materials
? Composite, Hybrid and Multifunctional Materials
o Challenges in Time-dependent Behavior Modeling Viscoelastoplasticity and Damage
o Effects of Interfaces and Interphases on the Time-Dependent Behavior
? Mechanics of materials from advanced manufacturing, such as additive manufacturing
o Property characterization from AM
o Process modeling and simulations of AM
o Material design using AM
? Time-dependent and Small-scale Effects in Micro/Nano-scale Testing