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Scan Statistics. 2001 ed..
・ISBN 978-0-387-98819-1 hard EUR 99.99
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| 著者・編者 | Glaz, Joseph / Naus, Joseph / Wallenstein, Sylvan, |
|---|---|
| シリーズ | Springer Series in Statistics |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2001 |
| ページ数 | 372 pp. |
| 言語 | ENG |
| ニュース番号 | ＜M25-19836＞ |
解説
In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.