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商品詳細
Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists.
・ISBN 978-1-032-24680-2 paper GB£ 55.99
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| 著者・編者 | ZhiLi, Dong, |
|---|---|
| シリーズ | (Advances in Materials Science and Engineering) |
| 出版社 | (CRC Press, UK) |
| 出版年月 | 2025 |
| ページ数 | 272 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A05-335＞ |
解説
The structure-property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.
- Introduces fundamentals of crystallography
- Covers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methods
- Describes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrasts
- Discusses applications of HRTEM in materials research
- Explains concepts used in XRD and TEM lab training
Based on the author's course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.