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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits. Softcover reprint of the original 1st ed. 1995
・ISBN 978-1-4613-5992-0 paper EUR 99.99
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| 著者・編者 | Roberts, Gordon W. / Lu, Albert K., |
|---|---|
| シリーズ | (The Springer International Series in Engineering and Computer Science) |
| 出版社 | (Springer-Verlag New York Inc., US) |
| 出版年月 | 2012 |
| ページ数 | 122 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A04-77301＞ |
解説
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.