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Using Imperfect Semiconductor Systems for Unique Identification. 1st ed. 2017
・ISBN 978-3-319-67890-0 hard EUR 99.99
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| 著者・編者 | Roberts, Jonathan, |
|---|---|
| シリーズ | (Springer Theses) |
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2017 |
| ページ数 | 123 pp. |
| 言語 | ENG |
| ニュース番号 | <A04-60709> |
解説
This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.