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商品詳細
Circadian Rhythms for Future Resilient Electronic Systems: Accelerated Active Self-Healing for Integrated Circuits. 2020 ed.
・ISBN 978-3-030-20053-4 paper EUR 99.99
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| 著者・編者 | Guo, Xinfei / Stan, Mircea R., |
|---|---|
| 出版社 | (Springer Nature Switzerland AG, SZ) |
| 出版年月 | 2020 |
| ページ数 | 208 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A03-93926＞ |
解説
This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models.
- Presents novel techniques, tested with experiments on real hardware;
- Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;
- Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;
- Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;
- Includes coverage of resilient aspects of emerging applications such as IoT.