株式会社極東書店トップ > 商品一覧 > Deep Learning for Advanced X-ray Detection and Imaging Applications. 2024 ed.
商品詳細
Deep Learning for Advanced X-ray Detection and Imaging Applications. 2024 ed.
・ISBN 978-3-031-75652-8 hard EUR 129.99
¥34,745.- (税込) ※(※)価格はご注文時の参考価格となります。
納品価格につきましては書籍の入荷時点で確定となります。
版元の原価改定、外国為替の変動等により異なる場合がございますので、予めご了承下さい。
| 著者・編者 | Iniewski, Krzysztof (Kris) / Cai, Liang (Kevin) (eds.), |
|---|---|
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2025 |
| ページ数 | 261 pp. |
| 言語 | ENG |
| ニュース番号 | <A03-71502> |
解説
This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.