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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. Third Edition 2018
・ISBN 978-3-319-99824-4 hard EUR 159.99
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| 著者・編者 | Breitenstein, Otwin / Warta, Wilhelm / Schubert, Martin C., |
|---|---|
| シリーズ | (Springer Series in Advanced Microelectronics) |
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2019 |
| ページ数 | 321 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A02-86477＞ |
解説
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.