株式会社極東書店トップ ＞ 商品一覧 ＞ VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. 1st ed. 2022
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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. 1st ed. 2022
・ISBN 978-3-031-21513-1 paper EUR 99.99
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| 著者・編者 | Shah, Ambika Prasad / Dasgupta, Sudeb / Darji, Anand / Tudu, Jaynarayan (eds.), |
|---|---|
| シリーズ | (Communications in Computer and Information Science) |
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2022 |
| ページ数 | 596 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A02-77205＞ |
解説
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.