株式会社極東書店トップ ＞ 商品一覧 ＞ Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental Principles and Solar Cell Characterization. 2018 ed.
商品詳細
Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental Principles and Solar Cell Characterization. 2018 ed.
・ISBN 978-3-319-75375-1 hard EUR 329.99
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| 著者・編者 | Fujiwara, Hiroyuki / Collins, Robert W. (eds.), |
|---|---|
| シリーズ | (Springer Series in Optical Sciences) |
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2019 |
| ページ数 | 594 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A02-75003＞ |
解説
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.