株式会社極東書店トップ ＞ 商品一覧 ＞ Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings. 2018 ed.
商品詳細
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings. 2018 ed.
・ISBN 978-3-319-97784-3 paper EUR 49.99
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| 著者・編者 | Bai, Xiao / Hancock, Edwin R. / Ho, Tin Kam / Wilson, Richard C. / Biggio, Battista / Robles-Kelly, Antonio (eds.), |
|---|---|
| シリーズ | (Lecture Notes in Computer Science) |
| 出版社 | (Springer International Publishing AG, SZ) |
| 出版年月 | 2018 |
| ページ数 | 524 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A01-77280＞ |
解説
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.
The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.
The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.