株式会社極東書店トップ商品一覧Trends in Artificial Intelligence Theory and Applications. Artificial Intelligence Practices: 33rd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2020, Kitakyushu, Japan, September 22-25, 2020, Proceedings. 1st ed. 2020

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Trends in Artificial Intelligence Theory and Applications. Artificial Intelligence Practices: 33rd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2020, Kitakyushu, Japan, September 22-25, 2020, Proceedings. 1st ed. 2020

Trends in Artificial Intelligence Theory and Applications. Artificial Intelligence Practices: 33rd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2020, Kitakyushu, Japan, September 22-25, 2020, Proceedings. 1st ed. 2020

・ISBN 978-3-030-55788-1 paper EUR 149.99

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お気に入り
著者・編者Fujita, Hamido / Fournier-Viger, Philippe / Ali, Moonis / Sasaki, Jun (eds.),
シリーズ (Lecture Notes in Computer Science)
出版社 (Springer Nature Switzerland AG, SZ)
出版年月2020
ページ数935 pp.
言語ENG
ニュース番号<A01-82398>

解説

This book constitutes the thoroughly refereed proceedings of the 33rd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2020, held in Kitakyushu, Japan, in September 2020.

The 62 full papers and 17 short papers presented were carefully reviewed and selected from 119 submissions. The IEA/AIE 2020 conference will continue the tradition of emphasizing on applications of applied intelligent systems to solve real-life problems in all areas. These areas include are language processing; robotics and drones; knowledge based systems; innovative applications of intelligent systems; industrial applications; networking applications; social network analysis; financial applications and blockchain; medical and health-related applications; anomaly detection and automated diagnosis; decision-support and agent-based systems; multimedia applications; machine learning; data management and data clustering; pattern mining; system control, classification, and fault diagnosis.