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商品詳細
Fundamentals of Electromigration-Aware Integrated Circuit Design. Softcover Reprint of the Original 1st 2018 ed.
・ISBN 978-3-030-08811-8 paper EUR 84.99
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| 著者・編者 | Lienig, Jens / Thiele, Matthias, |
|---|---|
| 出版社 | (Springer Nature Switzerland AG, SZ) |
| 出版年月 | 2018 |
| ページ数 | 159 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A01-94902＞ |
解説
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.