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商品詳細
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions.
・ISBN 978-1-032-37510-6 hard GB£ 145.99
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| 著者・編者 | Kumar, Ch Sateesh / Singh, M. Muralidhar / Krishna, Ram, |
|---|---|
| シリーズ | (Advanced Materials Processing and Manufacturing) |
| 出版社 | (CRC Press, UK) |
| 出版年月 | 2023 |
| ページ数 | 130 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A01-66263＞ |
解説
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
Features:
- Covers material characterization techniques and the development of advanced characterization technology
- Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
- Discusses advanced material characterization technology in the microstructural and property characterization fields
- Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
- Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies
This book is aimed at graduate students and researchers in materials science and engineering.