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Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing.

Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing.

・ISBN 978-0-19-857054-7 hard GB£ 142.50

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お気に入り
電子版あり 大学・学術機関向け電子ブック(eBook)ISBN 9780191717710
著者・編者Ekin, Jack,
出版社 (Oxford University Press, UK)
出版年月2006
ページ数704 pp.
言語ENG
ニュース番号<A00-61927>

解説

This book presents a highly integrated, step-by-step approach to the design and construction of low-temperature measurement apparatus. It is effectively two books in one: A textbook on cryostat design techniques and an appendix data handbook that provides materials-property data for carrying out that design. The main text encompasses a wide range of information, written for specialists, without leaving beginning students behind. After summarizing cooling methods, Part I provides core information in an accessible style on techniques for cryostat design and fabrication - including heat-transfer design, selection of materials, construction, wiring, and thermometry, accompanied by many graphs, data, and clear examples. Part II gives a practical user's perspective of sample mounting techniques and contact technology. Part III applies the information from Parts I and II to the measurement and analysis of superconductor critical currents, including in-depth measurement techniques and the latest developments in data analysis and scaling theory. The appendix is a ready reference handbook for cryostat design, encompassing seventy tables compiled from the contributions of experts and over fifty years of literature.