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商品詳細
Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces. Revised edition
・ISBN 978-0-19-509204-2 hard US$ 400.00
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★★★
| 著者・編者 | Sarid, Dror, |
|---|---|
| シリーズ | (Oxford Series in Optical and Imaging Sciences 5) |
| 出版社 | (Oxford University Press Inc, US) |
| 出版年月 | 1994 |
| ページ数 | 288 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A00-58069＞ |
解説
This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.