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Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement.

Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement.

・ISBN 978-0-367-02343-0 hard GB£ 145.99

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お気に入り
電子版あり 大学・学術機関向け電子ブック(eBook)ISBN 9780429399619
著者・編者Ma, Yue / Gontrand, Christian,
出版社 (CRC Press, UK)
出版年月2019
ページ数226 pp.
言語ENG
ニュース番号<A00-49657>

解説

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.