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商品詳細
Thermal-Aware Testing of Digital VLSI Circuits and Systems.
・ISBN 978-0-367-60709-8 paper GB£ 25.99
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| 著者・編者 | Chattopadhyay, Santanu, |
|---|---|
| 出版社 | (CRC Press, UK) |
| 出版年月 | 2020 |
| ページ数 | 118 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A00-46326＞ |
解説
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips