株式会社極東書店トップ ＞ 商品一覧 ＞ Computational Intelligence Techniques and Their Applications to Software Engineering Problems.
商品詳細
Computational Intelligence Techniques and Their Applications to Software Engineering Problems.
・ISBN 978-0-367-52974-1 hard GB£ 171.99
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| 著者・編者 | Bansal, Ankita / Jain, Abha / Jain, Sarika / Jain, Vishal / Choudhary, Ankur (eds.), |
|---|---|
| シリーズ | (Computational Intelligence Techniques) |
| 出版社 | (CRC Press, UK) |
| 出版年月 | 2020 |
| ページ数 | 251 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A00-42039＞ |
解説
Computational Intelligence Techniques and Their Applications to Software Engineering Problems focuses on computational intelligence approaches as applicable in varied areas of software engineering such as software requirement prioritization, cost estimation, reliability assessment, defect prediction, maintainability and quality prediction, size estimation, vulnerability prediction, test case selection and prioritization, and much more. The concepts of expert systems, case-based reasoning, fuzzy logic, genetic algorithms, swarm computing, and rough sets are introduced with their applications in software engineering. The field of knowledge discovery is explored using neural networks and data mining techniques by determining the underlying and hidden patterns in software data sets. Aimed at graduate students and researchers in computer science engineering, software engineering, information technology, this book:
- Covers various aspects of in-depth solutions of software engineering problems using computational intelligence techniques
- Discusses the latest evolutionary approaches to preliminary theory of different solve optimization problems under software engineering domain
- Covers heuristic as well as meta-heuristic algorithms designed to provide better and optimized solutions
- Illustrates applications including software requirement prioritization, software cost estimation, reliability assessment, software defect prediction, and more
- Highlights swarm intelligence-based optimization solutions for software testing and reliability problems