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X-Ray Diffraction Imaging: Technology and Applications.
・ISBN 978-1-4987-8361-3 hard GB£ 171.99
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| 著者・編者 | Greenberg, Joel (ed.), |
|---|---|
| シリーズ | (Devices, Circuits, and Systems) |
| 出版社 | (CRC Press Inc, US) |
| 出版年月 | 2018 |
| ページ数 | 256 pp. |
| 言語 | ENG |
| ニュース番号 | ＜A00-31030＞ |
解説
This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike.
- Teaches novel methods for X-ray diffraction imaging
- Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms
- Features state-of-the-art work of international authors from both academia and industry.
- Includes practical applications in the medical, industrial, and security sectors