株式会社極東書店トップ商品一覧III-V Compound Semiconductors: Integration with Silicon-Based Microelectronics.

商品詳細

III-V Compound Semiconductors: Integration with Silicon-Based Microelectronics.

III-V Compound Semiconductors: Integration with Silicon-Based Microelectronics.

・ISBN 978-1-4398-1522-9 hard GB£ 260.00

¥82,368.- (税込) (※)価格はご注文時の参考価格となります。
納品価格につきましては書籍の入荷時点で確定となります。
版元の原価改定、外国為替の変動等により異なる場合がございますので、予めご了承下さい。

お気に入り
電子版あり 大学・学術機関向け電子ブック(eBook)ISBN 9780429191626
著者・編者Li, Tingkai / Mastro, Michael / Dadgar, Armin (eds.),
出版社 (CRC Press Inc, US)
出版年月2010
ページ数604 pp.
言語ENG
ニュース番号<A00-26058>

解説

Silicon-based microelectronics has steadily improved in various performance-to-cost metrics. But after decades of processor scaling, fundamental limitations and considerable new challenges have emerged. The integration of compound semiconductors is the leading candidate to address many of these issues and to continue the relentless pursuit of more powerful, cost-effective processors.

III-V Compound Semiconductors: Integration with Silicon-Based Microelectronics covers recent progress in this area, addressing the two major revolutions occurring in the semiconductor industry: integration of compound semiconductors into Si microelectronics, and their fabrication on large-area Si substrates. The authors present a scientific and technological exploration of GaN, GaAs, and III-V compound semiconductor devices within Si microelectronics, building a fundamental foundation to help readers deal with relevant design and application issues.

Explores silicon-based CMOS applications developed within the cutting-edge DARPA program

Providing an overview of systems, devices, and their component materials, this book:



  • Describes structure, phase diagrams, and physical and chemical properties of III-V and Si materials, as well as integration challenges




  • Focuses on the key merits of GaN, including its importance in commercializing a new class of power diodes and transistors




  • Analyzes more traditional III-V materials, discussing their merits and drawbacks for device integration with Si microelectronics




  • Elucidates properties of III-V semiconductors and describes approaches to evaluate and characterize their attributes




  • Introduces novel technologies for the measurement and evaluation of material quality and device properties




  • Investi