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High Energy Electron Diffraction and Microscopy.

High Energy Electron Diffraction and Microscopy.

・ISBN 978-0-19-850074-2 hard GB£ 175.00

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お気に入り
電子版あり 大学・学術機関向け電子ブック(eBook)ISBN 9781383019926
著者・編者Peng, L.M. / Dudarev, S.L. / Whelan, M.J.,
シリーズ (Monographs on the Physics and Chemistry of Materials 61)
出版社 (Oxford University Press, UK)
出版年月2004
ページ数558 pp.
言語ENG
ニュース番号<A00-21387>

解説

This book provides the reader with a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.