株式会社極東書店トップ > 商品一覧 > Measurement Techniques for Radio Frequency Nanoelectronics.
商品詳細
Measurement Techniques for Radio Frequency Nanoelectronics.
・ISBN 978-1-107-12068-6 hard GB£ 129.00
¥40,867.- (税込) ※(※)価格はご注文時の参考価格となります。
納品価格につきましては書籍の入荷時点で確定となります。
版元の原価改定、外国為替の変動等により異なる場合がございますので、予めご了承下さい。
お気に入り
★★★
| 著者・編者 | Wallis, T. Mitch / Kabos, Pavel, |
|---|---|
| シリーズ | (The Cambridge RF and Microwave Engineering Series) |
| 出版社 | (Cambridge University Press, UK) |
| 出版年月 | 2017 |
| ページ数 | 328 pp. |
| 言語 | ENG |
| ニュース番号 | <A00-19079> |
解説
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. * Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides * Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy * Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.