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Modeling and Characterization of RF and Microwave Power FETs.

Modeling and Characterization of RF and Microwave Power FETs.

・ISBN 978-0-521-33617-8 paper GB£ 80.00

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電子版あり 大学・学術機関向け電子ブック(eBook)ISBN 9780511541124
著者・編者Aaen, Peter / Pla, Jaime A. / Wood, John,
シリーズ (The Cambridge RF and Microwave Engineering Series)
出版社 (Cambridge University Press, UK)
出版年月2011
ページ数380 pp.
言語ENG
ニュース番号<A00-18107>

解説

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.